High-Voltage Testing Laboratory
The high-voltage testing laboratory provides a wide range of possibilities in the field of short and long-term insulation testing. It has two independent testing halls, several smaller laboratories and an open-air testing area for voltage tests.
Wide range of possibilities
Besides high voltage testing, other examinations can be performed, among them measurements of conventional and UHF partial discharge (PD) radio interference voltage (RIV), measurements of dissipation factor and capacity, and rain tests. If required, monitoring camera systems and microscopes are used. In addition to the high voltage testing, the open-air testing area permits long-term insulation testing under DC and AC to simulate aging processes. The large test halls of the high-voltage testing laboratory are shielded. This makes sensitive PD measurements with a very low noise level of less than 1 pC possible. The high-voltage testing laboratory also permits tests for switching of bus-charging currents by GIS disconnectors. Furthermore, surge current test circuits for surge arrester tests are availableAbstract from the testing portfolio of the high-voltage testing laboratory
- Lightning impulse voltage
- Alternating voltage
- Direct voltage
- Switching impulse voltage
- Combined voltage tests
- Long-term tests of insulation materials under DC and AC
- Conventional and UHF partial discharge measurement (PD)
- Radio interference voltage tests (RIV)
- Measurements of dissipation factor and capacity
- Rain tests
Specifications
Current information
Benefit now from the new possibilities
Since March 2017 we perform temperature cycle tests from -65°C to +95°C on both, medium and high-voltage equipment, respectively, while stressed with test currents of up to 3150 amps and/or with test voltages of up to 100 kV. We also offer numerous DC tests as a standard part of our testing scope: dielectric tests up to 1,200 kV; long-term tests of insulation materials up to 500 kV; current tests up to 10 kA (e.g. temperature rise test).
